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Analytical methods and possibilities

Field emission scanning electron microscope

  1. analysis of sample in secondary electrons (SEI)
  2. analysis of sample in backscattered electrons (BEI)
  3. cathodoluminiscence (CL)

EDS and WDS microanalysis

  1. qualitative and quantitative electron microanalysis (EDS, WDS)
  2. analysis of sample in characteristic X-ray radiation – study of elements distribution

Backscattered electron diffraction system – EBSD

  1. EBSD – sample preparation, analysis of crystallographic orientation and structural identification of mineral phases

icon of contactsContacts

Czech Geological Survey
Geologická 577/6
152 00 Praha 5
phone: +420251085217/220
fax: +420 251 818 748
jakub.haloda@geologycz