Czech Geological Survey
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Offered services – analytical techniques & their possibilities

 

Scanning electron microscope CamScan CS 3200
a) sample analysis in the secondary electrons (SEI)
b) sample analysis in the back scattered electrons (BEI)

c) cathodoluminiscence (CL)

Microanalytical system Link ISIS 300 and Microspec 3PC
a) microanalytical system Link ISIS 300 and Microspec 3PC
b) Link ISIS 300 - X-ray analysis

Electron backscatter diffraction system – EBSD
a) development and special samples evolution for the EBSD analysis
b) mineral phase crystallographic orientation analysis
c) structural identification of mineral phases
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May 22, 2012
Contact
Mgr. Jakub Haloda
Czech Geological Survey
Geologická 6
152 00 Praha 5
tel: +420251085217220
fax: +420251818748
jakub.haloda@geologycz